Scanning Electron Microscope (SEM)

Scanning Electron Microscope (SEM) or Field Emission Scanning Electron Microscope (FE-SEM), is mostly used to characterize morphology of metallic nanofibre based composites.X-ray diffraction experiments are used to determine the phase. Further, the mechanical behaviors of metallic hybrid nanofibre composites are determined by a Universal Testing Machine (UTM-Machine) under a constant rate of extension at room temperature. According to the procedure of ASTM standard, samples are griped using roller clamps and proper gauge length is set. At least ten specimens are experimented for determination of tensile behaviour of the metallic nanofiber and then averaged values are reported. From each stress–strain curve, mostly three parameters are determined:tensile strength, Young’s modulus, and elongation at break.
Elastic modulus or Young’s modulus is calculated from the initial slope of the stress–strain curve. Tensile strength is measured from the stress at failure and the strain corresponding to the tensile strength is the failure strain.

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